The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

Jan. 12, 2004
Applicants:

Bradford G. Van Treuren, Lambertville, NJ (US);

Jose M. Miranda, Hamilton, NJ (US);

Paul J. Wheatley, Titusville, NJ (US);

Inventors:

Bradford G. Van Treuren, Lambertville, NJ (US);

Jose M. Miranda, Hamilton, NJ (US);

Paul J. Wheatley, Titusville, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A flexible Boundary Scan test system is disclosed. The system includes an interpreter module operable to execute a program element selected from a plurality of program elements that include at least one instruction type having an interface to identify and execute selected functions wherein each of the selected functions has associated therewith at least one data information item. In one aspect of the invention, selected ones of the functions are composed of a plurality of functions. In another aspect of the invention, the instruction includes parameters and adornments for determining the selected function execution.


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