The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2006
Filed:
Oct. 29, 2004
Joachim Grabscheid, Gerstetten, DE;
Klaus Hermann, Giengen, DE;
Thomas Augscheller, Bachhagel, DE;
Florian Wegmann, Herbrechtingen, DE;
Roland Mayer, Heidenheim, DE;
Georg Kleiser, Schwaebisch Gmuend, DE;
Joachim Grabscheid, Gerstetten, DE;
Klaus Hermann, Giengen, DE;
Thomas Augscheller, Bachhagel, DE;
Florian Wegmann, Herbrechtingen, DE;
Roland Mayer, Heidenheim, DE;
Georg Kleiser, Schwaebisch Gmuend, DE;
Voith Paper Patent GmbH, Heidenheim, DE;
Abstract
A system for computer assisted monitoring of a cross profile of a quality parameter of a material web, especially a paper or cardboard web during its production and/or conversion, which includes a measuring system for measuring the cross profile, at least one computer based operations and logic unit for the determination of the standard deviations of at least two interference profiles that are representative for different interferences in the form of different peak groups in the measured cross profile. The different peak groups differentiate in that their peaks have different width ranges. Elements for storage, display and/or further processing of the determined standard deviations are also included.