The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

Jul. 25, 2002
Applicants:

Richard J. Patz, Aptos, CA (US);

David Deas Sinkler Poor, Meadowbrook, PA (US);

Inventors:

Richard J. Patz, Aptos, CA (US);

David Deas Sinkler Poor, Meadowbrook, PA (US);

Assignee:

The McGraw-Hill Companies, Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09B 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The current invention is designed to improve the certainty of test-taker classifications in testing programs utilizing open-ended items. The current invention discloses methods to improve certainty in estimates of test-taker performance for all test-takers while using a minimum of scoring resources. The invention selectively allocates resources to scoring by ceasing to allocate scoring resources to test-takers whose performance has been determined with sufficient certainty, and by having an additional reader or readers score responses from test-takers whose scores are close to cutoff levels. The invention further increases precision of scores for test-takers near a cutoff by selectively allocating more reliable and accurate readers to score responses most likely to influence a test-taker's performance classification. Other scoring resources are also shown.


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