The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

May. 20, 2003
Applicants:

Yun Chur Chung, Daejeon, KR;

Seung Kyun Shin, Daejeon, KR;

Chul Han Kim, Goyang-si, KR;

Inventors:

Yun Chur Chung, Daejeon, KR;

Seung Kyun Shin, Daejeon, KR;

Chul Han Kim, Goyang-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 14/00 (2006.01); H04B 10/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method and an apparatus for monitoring optical signal to noise ratio (OSNR) in a wavelength division multiplexing optical transmission system. The present invention utilizes a polarization nulling method and a tunable optical bandpass filter in order to reliably monitor the OSNR by considering a finite polarization nulling ratio, polarization mode dispersion and non-linear birefringence of the optical system in real time measurement of the OSNR. Further, the tunable optical bandpass filter is controlled to filter all wavelength bands of wavelength division multiplexed signals. Since the invention may monitor a plurality of demultiplexed optical signals with a single apparatus, the overall cost of the OSNR monitoring equipment is significantly reduced.


Find Patent Forward Citations

Loading…