The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

Feb. 28, 2006
Applicants:

Christopher Doerr, Middletown, NJ (US);

Daniel Kilper, Rumson, NJ (US);

Lothar Moeller, Middletown, NJ (US);

Roland Ryf, Marlboro, NJ (US);

Chongjiin Xie, Marlboro, NJ (US);

Inventors:

Christopher Doerr, Middletown, NJ (US);

Daniel Kilper, Rumson, NJ (US);

Lothar Moeller, Middletown, NJ (US);

Roland Ryf, Marlboro, NJ (US);

Chongjiin Xie, Marlboro, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An orthogonal heterodyne in-band optical signal-to-noise-ratio (OSNR) monitoring method and apparatus that use the polarization characteristics of two narrow bandwidth filtered optical spectral components which is not only insensitive to the effects of polarization mode dispersion (PMD) and inter-channel cross-phase modulation (XPM) induced nonlinear polarization scattering, but also independent of bit rate and modulation format. The monitoring method is demonstrated for both linear and nonlinear systems.


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