The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

Feb. 17, 2004
Applicant:

BO Su Chen, Plano, TX (US);

Inventor:

Bo Su Chen, Plano, TX (US);

Assignee:

Finisar Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/32 (2006.01); G02B 6/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical system is adapted to produce reduced back reflection from a receiving detector back to a light source for increased system performance. The system may optically condition light signals from the light source for projection onto the detector. The conditioning may result in a light spot on the detector that has an annular intensity distribution or profile. The annular distribution may be attained in any number of ways including providing a slope discontinuity in the lens surface, providing an ax icon lens function, and/or providing a defocused light spot on the detector surface.


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