The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

Nov. 26, 2002
Applicants:

Larry Peele, Orlando, FL (US);

Eugene Cloud, Orlando, FL (US);

Inventors:

Larry Peele, Orlando, FL (US);

Eugene Cloud, Orlando, FL (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/46 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for image processing to detect changes in a scene includes compressing by computing a wavelet transform of an image corresponding to the scene, thresholding coefficients associated with the transform, and comparing a subset of coefficients with values to detect and indicate a change in the image. Values such as averages and a standard deviation therefrom can be generated during training by processing N training images. Determining whether a change has occurred includes determining the value of image sets, standard deviation and training sets, and comparing these, based on the type of change to be ascertained, to statistical information.


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