The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2006
Filed:
Nov. 22, 2002
Shih-jong J. Lee, Bellevue, WA (US);
Seho OH, Bellevue, WA (US);
Shih-Jong J. Lee, Bellevue, WA (US);
Seho Oh, Bellevue, WA (US);
Other;
Abstract
Rotation and scale invariant profiles are generated for matching to a pattern template using a fast regular shaped pattern construction method. The invention achieves rotation invariant matching, rotation and scale invariant matching, and/or scale invariant matching. Invariant profiles are used to perform fast rotation, rotation and scale, or scale invariant search for initial detection of match candidates. The rotation invariant contours of this invention approximate circular contours through use of regular shaped patterns such as octagon or multiple rotated octagons. Rotation invariant search does not depend on rotation angles and is very fast.