The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2006
Filed:
Jun. 27, 2003
Michael F. Kennedy, Ojai, CA (US);
Alan B. Lowell, Camarillo, CA (US);
Clinton J. Wooton, Littleton, CO (US);
Chong Yi, Ventura, CA (US);
Michael F. Kennedy, Ojai, CA (US);
Alan B. Lowell, Camarillo, CA (US);
Clinton J. Wooton, Littleton, CO (US);
Chong Yi, Ventura, CA (US);
Fluke Corporation, Everett, WA (US);
Abstract
A multi-unit test system performs automated and dynamically alterable, double-ended testing of telephone lines, whose service is provided on copper cable pairs. A prescribed set of (e.g., twelve) individual tests are executed either from a hand-held measurement unit, or by a central office-resident direct access test unit, or by a collaboration of the two. The hand-held measurement unit and the direct access test unit exchange FSK-based test control messages with one another that are effective to cause a selected electrical condition to be applied to a first portion of the wireline and to cause a prescribed electrical measurement to be made at a second portion of the wireline.