The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2006
Filed:
Jul. 14, 2004
Ilmar A. Hein, Schaumburg, IL (US);
Ilmar A. Hein, Schaumburg, IL (US);
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Medical Systems Corporation, Otawara, JP;
Abstract
An x-ray computed tomography system, method, and computer product that generates an x-ray beam with an x-ray generator and detects with an x-ray detector at least one characteristic of the x-ray beam generated by the x-ray generator, after the x-ray beam has passed through an object, the system including a converting unit configured to obtain analog projection data outputted by the x-ray detector and to convert the analog projection data to digital projection data, and a processing unit configured to obtain the digital projection data from the converting unit, to detect overflow digital projection data that overflows a measuring range of the computed tomography system, and to correct the overflow digital projection data of the digital projection data by using a curve fitting function.