The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7148960 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 12, 2006

Filed:

Aug. 14, 2003
Applicants:

Jeffrey A. Schuster, Oakland, CA (US);

Sudarsan Srinivasan, Fremont, CA (US);

Thor Miller Wilbanks, Berkeley, CA (US);

Inventors:

Jeffrey A. Schuster, Oakland, CA (US);

Sudarsan Srinivasan, Fremont, CA (US);

Thor Miller Wilbanks, Berkeley, CA (US);

Assignee:

Aradigm Corporation, Hayward, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method for fabricating and inspecting small holes in a material are disclosed. The method includes directing light onto the material and through the holes formed in the material, and then collecting the light passing through the holes in the material onto a detector. The methods further include analyzing the light for properties of the holes, and modifying the process based these detected properties.


Find Patent Forward Citations

Schuster, Jeffrey. (2006). Method and device for non-destructive analysis of perforations in a material (U.S. Patent No. 7148960). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7148960

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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