The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

Aug. 27, 2004
Applicants:

Takuo Miyagishima, Torrance, CA (US);

John James Galt, Glendale, CA (US);

Inventors:

Takuo Miyagishima, Torrance, CA (US);

John James Galt, Glendale, CA (US);

Assignee:

Panavision International, L.P., Woodland Hills, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 19/18 (2006.01); G02B 13/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An anamorphic imaging system is disclosed which maximizes the use of available image area to minimize display magnification and image degradation due to display magnification, reduces the amount of anamorphic squeeze during photography to lower image degradation due to anamorphosis, and in film applications, utilizes a film frame that is only three perforations in height to reduce the amount of original film needed. The frame for either film or digital applications has an aspect ratio of approximately 16:9, is contained within the total available frame area of a three-perforation frame or digital imager, and is sized to maximize image area. In preferred embodiments, the image capture area is approximately 0.900 inches wide by approximately 0.506 inches tall.


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