The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2006
Filed:
May. 03, 2005
Andrew D. Fernandez, Palo Alto, CA (US);
Vamsi K. Srikantam, Fremont, CA (US);
Robert M. R. Neff, Palo Alto, CA (US);
Kenneth D. Poulton, Palo Alto, CA (US);
Andrew D. Fernandez, Palo Alto, CA (US);
Vamsi K. Srikantam, Fremont, CA (US);
Robert M. R. Neff, Palo Alto, CA (US);
Kenneth D. Poulton, Palo Alto, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A method for calibrating time interleaved samplers comprising applying a calibration signal to a time-interleaved sampling device, wherein the signal is coherent with at least one sample clock on the device and is periodic and has a predetermined spectral content and frequency, sampling, by said time-interleaved sampling device, the calibration signal at a plurality of phases to form samples, averaging the formed samples, and calculating the phase error of each sample based on the average calibration signal sample.