The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7148719 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 12, 2006

Filed:

Mar. 28, 2005
Applicants:

Jou-hahn Lee, Gyeonggi-do, KR;

Hyun-jun Shin, Gyeongsangbuk-do, KR;

Jong-sun Lim, Yeongdeungpo-gu, KR;

Ha-jin Song, Gyeongsangbuk-do, KR;

Inventors:

Jou-hahn Lee, Gyeonggi-do, KR;

Hyun-jun Shin, Gyeongsangbuk-do, KR;

Jong-sun Lim, Yeongdeungpo-gu, KR;

Ha-jin Song, Gyeongsangbuk-do, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a method for analyzing the performance of an OLED through activation in-situ. The method includes placing the OLED in an in-situ chamber, driving the OLED, and analyzing a dark spot and/or thermal degradation of the OLED, such that performance of the OLED can be analyzed while driving the OLED in-situ, separated from the external environment.


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Lee, Jou-hahn. (2006). Method for analyzing organic light-emitting device (U.S. Patent No. 7148719). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7148719

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