The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

Mar. 30, 2005
Applicants:

Kenneth H. Wong, Santa Rosa, CA (US);

David V. Blackham, Santa Rosa, CA (US);

Joel P. Dunsmore, Sebastopol, CA (US);

Inventors:

Kenneth H. Wong, Santa Rosa, CA (US);

David V. Blackham, Santa Rosa, CA (US);

Joel P. Dunsmore, Sebastopol, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 27/04 (2006.01); G01R 35/00 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a vector network analyzer (VNA) comprises a plurality of ports for coupling to a device under test (DUT), at least one reference receiver for measuring signals associated with the DUT, and logic for processing measurement data from the at least one reference receiver to compensate for transmission line effects, wherein the logic for processing evaluates a function, of several controllable variables, that is a sum of multiple transmission line models, wherein each of the controllable variables is related to a respective transmission line length associated with a corresponding transmission line model.


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