The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

May. 13, 2004
Applicants:

Gregory C. Loney, Concord, MA (US);

Nathan K. Weiner, Upton, MA (US);

Inventors:

Gregory C. Loney, Concord, MA (US);

Nathan K. Weiner, Upton, MA (US);

Assignee:

Affymetrix, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for scanning a probe array is described. The method comprises tuning an excitation light to a plurality of wavelengths each within an excitation range of a fluorescent label associated with one or more target molecules; and directing the tuned excitation light of each wavelength at the probe array.


Find Patent Forward Citations

Loney, Gregory. (2006). System, method, and product for providing a wavelength tunable excitation beam (U.S. Patent No. 7148492). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7148492

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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