The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

Aug. 31, 2004
Applicants:

Shinichi Yamaguchi, Kyouto-fu, JP;

Morio Ishihara, Osaka-fu, JP;

Michisato Toyoda, Osaka-fu, JP;

Daisuke Okumura, Osaka-fu, JP;

Inventors:

Shinichi Yamaguchi, Kyouto-fu, JP;

Morio Ishihara, Osaka-fu, JP;

Michisato Toyoda, Osaka-fu, JP;

Daisuke Okumura, Osaka-fu, JP;

Assignees:

Shimadzu Corporation, Kyoto, JP;

Osaka University, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a time of flight mass spectrometer (TOF-MS) of the present invention, a flight controller makes ions fly a loop orbit a predetermined number of turns, and an ion detector detects the ions at each turn of the flight. A flight time measurer measures the length of flight time of ions of a same mass to charge ratio at every turn, and a data processor constructs a spectrum of flight time. The data processor further computes the Fourier transformation of the spectrum, and determines the mass to charge ratio of the ions based on a frequency peak appearing in the Fourier transformation.


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