The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

Sep. 21, 2001
Applicants:

Yuji Sugita, Saitama, JP;

Ryoichi Hashida, Ibaraki, JP;

Kaoru Ogawa, Ibaraki, JP;

Tomoko Fujishima, Tokyo, JP;

Takeshi Nagasu, Ibaraki, JP;

Gozoh Tsujimoto, Tokyo, JP;

Eiki Takahashi, Chiba, JP;

Inventors:

Yuji Sugita, Saitama, JP;

Ryoichi Hashida, Ibaraki, JP;

Kaoru Ogawa, Ibaraki, JP;

Tomoko Fujishima, Tokyo, JP;

Takeshi Nagasu, Ibaraki, JP;

Gozoh Tsujimoto, Tokyo, JP;

Eiki Takahashi, Chiba, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

The differential display method was used to search for a gene whose expression level in eosinophils collected from patients with atopic dermatitis differs in the exacerbation stage and in the remission stage. As a result, gene '2090-05' showing a significant increase in expression in eosinophils of patients in the remission stage was isolated. This gene is usable in testing for an allergic disease and screening for a candidate compound for a therapeutic agent therefor an allergic disease.


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