The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2006
Filed:
Oct. 20, 2000
Kristian Hohla, 85591 Vaterstetten, DE;
Thomas Neuhann, 80803 Munchen, DE;
Gerhard Youssefi, D-84028 Landshut, DE;
Roland Toennies, D-82140 Olching, DE;
Kristian Hohla, 85591 Vaterstetten, DE;
Thomas Neuhann, 80803 Munchen, DE;
Gerhard Youssefi, D-84028 Landshut, DE;
Roland Toennies, D-82140 Olching, DE;
Other;
Abstract
A system and method are provided in which an iris or eye image is taken during a refractive diagnostic analysis. The image is employed for aligning data from the analysis with data from other refractive analysis instruments, as well as aligning a refractive surgical tool, such as a laser, with the eye for treatment. Further, the stored iris image is compared with the patient's iris before treatment, verifying that the correct eye is to be treated with a developed treatment pattern. A variety of refractive instruments can be used, such as corneal topography systems and wavefront aberration systems.