The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2006

Filed:

Dec. 18, 2002
Applicants:

Terry Dennis Allen, San Jose, CA (US);

Hsiuying Cheng, Fremont, CA (US);

Fen-ling Lin, San Jose, CA (US);

Akira Shibamiya, Los Altos, CA (US);

Annie S. Tsang, Saratoga, CA (US);

Inventors:

Terry Dennis Allen, San Jose, CA (US);

Hsiuying Cheng, Fremont, CA (US);

Fen-Ling Lin, San Jose, CA (US);

Akira Shibamiya, Los Altos, CA (US);

Annie S. Tsang, Saratoga, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Aspects for improving response time for database query execution are described. The aspects include comparing an estimate of sort pages needed for a database query against at least one threshold. A determination of whether to perform a parallel sort for the database query based on the comparison occurs, wherein response time improvement by the parallel sort is balanced against resource overhead of the parallel sort.


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