The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2006
Filed:
Jul. 09, 2003
Thomas Maucksch, Tuntenhausen, DE;
Uwe Baeder, Ottobrunn, DE;
Thomas Maucksch, Tuntenhausen, DE;
Uwe Baeder, Ottobrunn, DE;
Abstract
The invention concerns a method to evaluate whether a statistical time delay (TD) between a first event and a second event of a device under test is better than a test limit (TL). The method includes the steps: performing a minimum number N of tests and evaluating the time delay (TD) from each test; modeling a first probability distribution (P) of the evaluated time delays (TD); obtaining a second probability distribution (P) of the evaluated time delays (TD); performing a statistical transformation in order to obtain a third probability distribution (P) of the evaluated time delays (TD); and deciding to pass the device under test, if a certain percentage of the area of the third probability distribution (P) is on a good side (GS) of the test limit (TL).