The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2006
Filed:
Jul. 10, 2002
Walter D. Clark, Fullerton, CA (US);
Richard L. Hoffman, Rancho Palos Verdes, CA (US);
Walter D. Clark, Fullerton, CA (US);
Richard L. Hoffman, Rancho Palos Verdes, CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
The present invention includes a method for analyzing an image to screen for target candidates wherein an edge-follower detects straight segments within a plurality of longer edges and detects also from the longer edges, contours that go around areas that are the right size. The invention also contemplates starting the edge-follower from seeds on the image and terminating the edge-following process if the edge meanders too much to ever become an acceptable contour. In accordance with another embodiment, the straight segments can be further screened by measuring the gradient direction and then noting the deviation from the mean of those direction values. The highly straight edges thus found, in confluence with each other, or near a correct size contour define likely candidates.