The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2006
Filed:
Feb. 13, 2004
Takuya Sakaguchi, Tochigi-ken, JP;
Akira Tsukamoto, Tochigi-ken, JP;
Takuya Sakaguchi, Tochigi-ken, JP;
Akira Tsukamoto, Tochigi-ken, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A method for obtaining an X-ray image for an X-ray diagnosis apparatus including plurality of imaging systems, including: collecting first scatter data using a first X-ray detector after an X-ray is irradiated from a first X-ray tube in a first imaging system; collecting second scatter data using a second X-ray detector after an X-ray is irradiated from a second X-ray tube in a second imaging system; collecting first image data including a scatter component using X-ray detectors after an X-ray is irradiated from a third X-ray tube in the first imaging system; collecting second image data including a scatter component using X-ray detectors after an X-ray is irradiated from a fourth X-ray tube in the second imaging system; and obtaining X-ray images for the first and second imaging systems by subtracting the first and second scatter data from the first and second image data including a scatter component, respectively.