The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2006
Filed:
Jun. 01, 2005
Hiroyuki Urushiya, Saitama-ken, JP;
Hiroyuki Urushiya, Saitama-ken, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
To obtain a tomographic image suffering little from artifact and the determination of the quality of image. (1) Step 1: With the axis of abscissas as the fan angle or channel direction of an X-ray detector and the axis of ordinates as the projection angle direction of an X-ray sourceprojection data are arranged side by side to thereby prepare a sinogram. (2) Step 2: from the sinogram, the projection data of an opposite fan beam is prepared at each projection angle. (3) Step 3: the degree of consistency with the projection data of the opposite fan beam is obtained at each projection angle. (4) Step 4: The region of reference error of the degree of consistency is obtained, and a projection angle region is determined from this region of reference error. (5) Step 5: the projection data in the projection angle region obtained at the step 4 is reconstructed to thereby prepare a tomographic image.