The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2006

Filed:

Jul. 07, 2003
Applicant:

Bao-chi Peng, Hsin-Chu, TW;

Inventor:

Bao-Chi Peng, Hsin-Chu, TW;

Assignee:

Beno Corporation, Tao-Yuan Hsien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A frequency offset detector for AFC under Rayleigh fading. The AFC includes a variable phase generator, an exponential term emultiplied on an incoming signal, a low-pass filter, a gain amplifier, a multiplier, and an offset detector. The offset detector includes a filter, an amplifier, a delay block, three adders, and two blocks that output the absolute value of an inputted signal. The filter is a Finite Impulse Response (FIR) filter that produces a Hilbert Transformation of the inputted complex gain. The Hilbert FIR filter, together with the complex gain and two of the adders, generate two complex signals: Xp and Xn respectively representing the positive and negative frequency components of the inputted complex gain. The detector output is equal to the difference between the magnitudes of Xp and Xn.


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