The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2006
Filed:
Mar. 23, 2004
Applicants:
Tetsuya Fukuoka, Hamura, JP;
Mikio Yamagishi, Iruma, JP;
Inventors:
Tetsuya Fukuoka, Hamura, JP;
Mikio Yamagishi, Iruma, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
A semiconductor integrated circuit device is provided with a diagnosis circuit, which does not increase the delay of a logic element in normal operation. In a latch provided at the output of a memory or at the input of a logic stage, a signal selector is provided in the feedback loop of the latch. The selector is switched in correspondence with the operation mode, such that it transfers the feedback signal in normal operation, while it transfers the test signal in a test mode, in order to prevent the delay from increasing in the signal selector on the main path in normal operation.