The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2006

Filed:

Dec. 15, 2000
Applicant:

Katherine E. Hayes, Rochester, NY (US);

Inventor:

Katherine E. Hayes, Rochester, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A comment is compared to path mappings within a network for identifying a potential pathname of output data for an object within the publication data. If the output data is does not exist at the potential pathname, the comment is compared to search paths within the network to identify the potential pathname of the output data within the publication data. The potential pathname is substituted for the comment in the publication data. The publication data is prescanned. Optionally, the output data is gathered at a local disk. The publication data is output to an output medium via an output device.


Find Patent Forward Citations

Hayes, Katherine. (2006). Method and apparatus for determining a location of data in an open specification environment (U.S. Patent No. 7145674). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7145674

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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