The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2006
Filed:
Aug. 05, 2003
Seong Yun Jeong, Seoul, KR;
Jin Yong Kim, Seongnam-si, KR;
Jin Hong Kim, Yongin-si, KR;
Hun Seo, Yongin-si, KR;
Keum Cheol Kwak, Seoul, KR;
Seong Yun Jeong, Seoul, KR;
Jin Yong Kim, Seongnam-si, KR;
Jin Hong Kim, Yongin-si, KR;
Hun Seo, Yongin-si, KR;
Keum Cheol Kwak, Seoul, KR;
LG Electronics, Inc., Seoul, KR;
Abstract
A method of measuring thickness of an optical disc by using an interference effect of the optical disc layer is disclosed. The method includes detecting an intensity of a reflective light according to a wavelength of a light as spectrum data for each wavelength, converting the detected spectrum data for each wavelength into a spectrum value as a function of a wavelength that a refractive index is reflected, and detecting a position where the intensity of the reflective light has a peak as a thickness of a spacer layer and a cover layer respectively by converting the converted value into a length of an interference area for representing a layer thickness of the optical disc by the Fast Fourier Transform. The disclosed method has advantages for high precisely measuring thickness of an optical disc.