The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2006

Filed:

Aug. 28, 2002
Applicants:

Toshiki Yamane, Sakai, JP;

Masayuki Hattori, Kyoutanabe, JP;

Jun Nishijima, Katono, JP;

Osamu Iijima, Itabashi-ku, JP;

Yoshinori Koizumi, Yokohama, JP;

Inventors:

Toshiki Yamane, Sakai, JP;

Masayuki Hattori, Kyoutanabe, JP;

Jun Nishijima, Katono, JP;

Osamu Iijima, Itabashi-ku, JP;

Yoshinori Koizumi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing and inspection system includes a master device () having a video camera () and a first controller () responsible for processing and inspecting the image of an object () in accordance with inspection criteria. Intercommunicated () with the master device () is a personal computer () equipped with a second monitor (), and a second input member (). The motion-picture taken by the camera () for inspection on the side of the master device () is transmitted to the computer () so as to be displayed on the second monitor () as a real-time image of the object () for easy confirmation of the object on the side of the computer (), thereby enabling to determine the inspection criteria on the side of the computer () while monitoring the real-time image of the object ().


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