The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2006
Filed:
May. 25, 2005
Naoki Ando, Kanagawa, JP;
Naoki Ando, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
The test circuit of a display apparatus according to the invention detect short-circuiting in each of the data lines Dn by inputting the electric potential Vd of the data line Dn connected to the corresponding one of high resistance first short-circuiting detecting resistors Trln connecting a predetermined electric potential and the data line Dn to the corresponding one of first detector logic circuits and binarizing and outputting the input electric potential Vd of the data line Dn by referring to a predetermined threshold value and also detect short-circuiting in each of the gate lines Gm by inputting the electric potential of the gate line Gm connected to the corresponding one of high resistance second short-circuiting detecting resistors connecting a predetermined electric potential and the gate line Gm to the corresponding one of second detector logic circuits and binarizing and outputting the input electric potential of the gate line by referring to a predetermined threshold value. The defects (short-circuits) produced in the process of manufacturing the display apparatus can be inspected by a simple technique.