The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7145351 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 05, 2006

Filed:

Jan. 22, 2004
Applicants:

Yasunori Mizoguchi, Hamamatsu, JP;

Toru Ishii, Hamamatsu, JP;

Kengo Tsuchida, Hamamatsu, JP;

Inventors:

Yasunori Mizoguchi, Hamamatsu, JP;

Toru Ishii, Hamamatsu, JP;

Kengo Tsuchida, Hamamatsu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electrical inspection apparatus performs highly accurate electrical inspection using an inspection probe on any type of printed board without changing an instrument therefor. It comprises a reference position regulating member for positioning the printed board precisely at a predetermined reference position and a pressing member for pressing the printed board oppositely to the reference position regulating member. An inspected portion (e.g., a contact) of the printed board is fixed under tension and is precisely located at the reference position in planar condition by being contacted and positioned by the reference position regulating member, whereby it is subjected to electrical inspection using the inspection probe accompanied with the reference position regulating member and/or the pressing member. Thus, it is possible to prevent the inspection probe from being unexpectedly damaged or destroyed by excessive force that is produced due to inaccurate positioning therefor.


Find Patent Forward Citations

Mizoguchi, Yasunori. (2006). Electrical inspection apparatus (U.S. Patent No. 7145351). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7145351

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