The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2006

Filed:

Sep. 14, 1999
Applicant:

Kunio Sekiya, Tokyo, JP;

Inventor:

Kunio Sekiya, Tokyo, JP;

Assignee:

Maintech Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21F 1/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method of preventing contamination of a dryer of a paper machine so that predetermined effects of contamination prevention over the long term can always be ensured while maintaining satisfactory drying efficiency. With the method of preventing contamination of the surface of the drum dryer used in a paper machine, a predetermined amount of a surface treatment agent P is continuously supplied to the surface of the drum dryer Cin rotation, facing a paper strip W, while the paper strip is being fed by the paper machine in operation.


Find Patent Forward Citations

Sekiya, Kunio. (2006). Pollution control method for cylindrical dryer used in paper machine (U.S. Patent No. 7144478). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7144478

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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