The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2006

Filed:

Apr. 29, 2000
Applicants:

Gerald L Everett, Alta, CA (US);

Kent a Dickey, Westford, MA (US);

Inventors:

Gerald L Everett, Alta, CA (US);

Kent A Dickey, Westford, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for testing the memory in a system with two or more processing units is provided that generally involves the following acts. The memory is divided into two or more sections—one for each of the two or more processing units. Thus, each processing unit has an associated memory section. The memory is then checked with each memory section being checked with its associated processing unit. The act of checking the memory includes causing the address of a first encountered faulty location to be stored and causing a flag to be set in response to encountering a second faulty location. Finally, it is determined whether the flag has been set after the memory is checked. If so, a walk-through routine is then performed.


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