The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Jan. 22, 2003
Yael Gavish, Zichron Yaakov, IL;
Gal Eshel, Tel Aviv, IL;
Michal Geva, Kiryat Ono, IL;
Eran Davidov, Nahariya, IL;
Yael Gavish, Zichron Yaakov, IL;
Gal Eshel, Tel Aviv, IL;
Michal Geva, Kiryat Ono, IL;
Eran Davidov, Nahariya, IL;
Sun Microsystems Inc., Palo Alto, CA (US);
Abstract
A testing harness for a design-under-test is modified to include a standalone implementation of an application programming interface used in developing the design-under-test. The standalone implementation is adapted to a target device, and is packaged with an executable application or MIDlet, together with any needed resource files. Either the package, or optionally a JAR and JAD file, is downloaded to a remote user for execution on the target device. Using the application programming interface and the other downloaded files, the remote user can test the target device, analyze the results, and even modify the test conditions without recourse to the testing harness. The arrangement provides a capability for a party who is not privileged to know details of the testing harness to practically evaluate and modify the design-under-test using a standalone testing application.