The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2006

Filed:

May. 10, 2002
Applicants:

Ying Chen, Beijing, CN;

Fang Yan Rao, Beijing, CN;

Knut Stolze, San Jose, CA (US);

Inventors:

Ying Chen, Beijing, CN;

Fang Yan Rao, Beijing, CN;

Knut Stolze, San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems, methods, and computer products that improve the techniques used to search multidimensional databases over techniques of the past. The preferred embodiment of the present invention advantageously improves the technique of determining a grid index that is used to locate a geometric shape in a spatial database. More particularly, the preferred embodiment of the present invention improves the technique of sampling data for defining the grid cell size in a grid for a given data set, thereby improving the grid indexing process that locates a particular minimum-bounding rectangle and the associated geometric shape.


Find Patent Forward Citations

Chen, Ying. (2006). Systems, methods, and computer program products to reduce computer processing in grid cell size determination for indexing of multidimensional databases (U.S. Patent No. 7143098). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7143098

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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