The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Sep. 20, 2004
Günter Grupp, Böohmenkirch, DE;
Andreas Fuchs, Aalen, DE;
Walter Jenisch, Heidenheim, DE;
Ralf Bernhardt, Aalen, DE;
Harald Schmid, Aalen, DE;
Ulrich Staaden, Heidenheim, DE;
Günter Grupp, Böohmenkirch, DE;
Andreas Fuchs, Aalen, DE;
Walter Jenisch, Heidenheim, DE;
Ralf Bernhardt, Aalen, DE;
Harald Schmid, Aalen, DE;
Ulrich Staaden, Heidenheim, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A method for correcting errors in a coordinate measuring machine having a measuring head which is adapted to move in at least two different spatial directions. Measuring scales and measuring lines are assigned to each spatial direction. The measuring lines of different spatial directions intersect, and correction values are determined along the measuring lines at predetermined values of the scales in order to correct for elastic and/or geometric errors of the scales and/or of the guiding mechanism for moving the measuring head. According to one aspect of the invention, the correction values determined along a measuring line of a first spatial direction are modified such that the modified correction value of this measuring line assumes a predetermined value at the point of intersection with a first measuring line of a second spatial direction.