The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Dec. 17, 2002
William Notovitz, Marion, NY (US);
Stuart Alan Schweid, Pittsford, NY (US);
William Notovitz, Marion, NY (US);
Stuart Alan Schweid, Pittsford, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
A parallel, non-iterative, memory efficient method of determining image skew. A document skew angle is determined from a fast scan second order moment data set and a slow scan second order moment data set. A slow scan second order moment data set can be generated by receiving a current scanline of image data, updating columns sums for a set of rotation angles using scanlines within a buffer comprising a band having a predetermined number B of scanlines, and updating the buffer with the current scanline. A fast scan second order moment data set is generated by projecting a plurality of pixels within each scanline of image data received to a first rotation angle wherein the plurality pixels project onto M rows; updating M memory locations, wherein each one of the M memory locations corresponds to one of the M rows and wherein each memory location is updated using pixels projecting onto the corresponding row whereby one of the M memory locations contains a completed row; and adding the square of the completed row sum to a moment accumulator.