The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Oct. 28, 2002
Shih-jong J. Lee, Bellevue, WA (US);
Seho OH, Bellevue, WA (US);
Donglok Kim, Issaquah, WA (US);
Other;
Abstract
An accumulation transformation method for fast pattern search accurately locates general patterns of interest. The method can be used for fast invariant search to match patterns of interest in images where the searched pattern varies in size or orientation or aspect ratio, when pattern appearance is degraded, when the pattern is partially occluded, where the searched image is large, multidimensional, or very high resolution, or where the pattern size is large. The accumulation transformations of the input image are determined based upon the searched projection directions. Projection profile result images are derived from the accumulation transformed input image and used for fast matching with template pattern projection profiles.