The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2006

Filed:

Jul. 22, 2003
Applicants:

Keigo Ihara, Chiba, JP;

Junichi Rekimoto, Tokyo, JP;

Shinji Nakajima, Chiba, JP;

Takahiko Sueyoshi, Tokyo, JP;

Inventors:

Keigo Ihara, Chiba, JP;

Junichi Rekimoto, Tokyo, JP;

Shinji Nakajima, Chiba, JP;

Takahiko Sueyoshi, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A two-dimensional code recognition processing method for recognizing a two-dimensional code lade of a plurality of square cells arranged in accordance with predetermined layout rules. The method comprises the steps of: generating binary data from image information acquired externally in accordance with a predetermined threshold value; detecting a reference cell serving as a reference in recognizing the two-dimensional code based on the binary data generated in the binary data generating step; detecting corner cells each located in a predetermined search range with respect to the reference cell detected in the reference cell detecting step, on the basis of the binary data generated in the binary data generating step; and detecting code data assigned to the two-dimensional code existing inside an area of a code part enclosed by the reference cell and by the corner cells on the basis of the binary data generated in the binary data generating step.


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