The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Sep. 23, 2003
Jiang Hsieh, Brookfield, WI (US);
Eugene Clifford Williams, Waukesha, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Eugene Clifford Williams, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method and system for an improved data acquisition system with an image detector array and an image processing system which finds a malfunctioning cell, interpolates a signal for the malfunctioning cell using neighboring channels of the cell, and corrects the interpolation with an error rate found in performing interpolations on neighboring rows with cells which are not malfunctioning. The image processing system may include a DAS and a reconstruction system. The step of finding a malfunctioning cell may be accomplished through a variety of methods, such as measuring discrepancies between a cell's and its neighboring cell's average readings over time and exposing the cells to x-rays which should produce similar readings in all the cells and comparing the cells' signals, looking for discrepancies. The step of interpolating and the step of correcting may take into consideration cells within the same projection view as the malfunctioning cell.