The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Mar. 14, 1997
Edward W. Stark, New York, NY (US);
Edward W. Stark, New York, NY (US);
Other;
Abstract
Apparatus and a method are disclosed for the simultaneous or rapid sequential use of two or more different separations between the source and detector of the measuring apparatus to obtain spectral measurement data in diffuse transmission or 'interaction' modes of collecting optical information from a specimen. The method and apparatus subsequently combine separate data taken from two or more different pathlengths to provide discrimination against undesired information while preserving or enhancing desired information. Additional reference information to normalize the optical signal is also provided. The optical and mechanical design of the optical probe also provides for transmittance, reflectance and interactance measurements on small amounts of specimen.