The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Mar. 25, 2005
Jun Yamaguchi, Tokyo, JP;
Akihiko Hattori, Tokyo, JP;
Jun Yamaguchi, Tokyo, JP;
Akihiko Hattori, Tokyo, JP;
Nippon Sheet Glass Company, Limited, Tokyo, JP;
Abstract
There is provided a microchemical system which dispenses with the optical axis alignment and positioning of the focal point of the detecting light and that of the exciting light, and is capable of carrying out measurement with high sensitivity. The microchemical system includes a channel-formed plate-shaped member containing a sample, an exciting light source that irradiates exciting light onto the sample via a converging lens, a detecting light source that irradiates detecting light onto a thermal lens formed within the sample by the irradiated exciting light, via the converging lens, and detecting means for detecting the irradiated detecting light via the formed thermal lens. The exciting light source and the detecting light source are connected to the converging lens via an optical fiber for propagating the exciting light and the detecting light to the converging lens. The converging lens is fixed to the channel-formed plate-shaped member, and the optical fiber has a joint part capable of disconnecting the exciting light source and the detecting light source from the converging lens.