The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2006

Filed:

Sep. 14, 2000
Applicants:

Randall L. Barbour, Glen Head, NY (US);

Yaling Pei, Morris Plains, NJ (US);

Inventors:

Randall L. Barbour, Glen Head, NY (US);

Yaling Pei, Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention recognizes that contrary to intuitive expectations, sensitivity and resolution of the data for image reconstruction can be increased by decreasing the absorption or scattering mean free path length of the imaging source energy. Methods are disclosed in this respect for enhancing sensitivity and resolution in the imaging of scattering target media (). In one method, source energy wavelength is selected to optimize scattering and absorption of the energy while maintaining measurable and acceptable detector signals (). In another aspect of the invention, the scattering target medium () is radially compressed and the imaging source wavelength is then adjusted in conjunction with the compression to improve sensitivity and resolution.


Find Patent Forward Citations

Barbour, Randall. (2006). Method and system for enhanced imaging of a scattering medium (U.S. Patent No. 7142304). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7142304

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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