The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Apr. 02, 2004
Tsuyoshi Wakuda, Hitachi, JP;
Michiya Okada, Mito, JP;
Tomomi Kikuta, Hitachi, JP;
Kohji Maki, Hitachi, JP;
Hiroshi Morita, Hitachi, JP;
Shuichi Kido, Hitachi, JP;
Tomoo Chiba, Hitachi, JP;
Hideo Tsukamoto, Hitachi, JP;
Tsuyoshi Wakuda, Hitachi, JP;
Michiya Okada, Mito, JP;
Tomomi Kikuta, Hitachi, JP;
Kohji Maki, Hitachi, JP;
Hiroshi Morita, Hitachi, JP;
Shuichi Kido, Hitachi, JP;
Tomoo Chiba, Hitachi, JP;
Hideo Tsukamoto, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
To access a measurement space located at the center of the magnet, an access port is provided in the direction of the magnet's axis, a clearance is provided in the coil winding portion, and another access port passes through the clearance so that a sample can be positioned perpendicularly to the coil axis. According to this configuration, an access port passing through the coil winding portion can be smaller than the access port passing through the coil axis, a sample is inserted from the access port, and a probe is inserted from the access port passing through the magnet axis, and thus the clearance can be minimized.