The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2006

Filed:

Jun. 16, 2003
Applicants:

Kent D. Taylor, Ventura, CA (US);

Jerome I. Rotter, Los Angeles, CA (US);

Huiying Yang, Cerritos, CA (US);

Willa A. Hsueh, Pacific Palisades, CA (US);

Xiuqing Guo, Santa Monica, CA (US);

Leslie J. Raffel, Los Angeles, CA (US);

Mark O. Goodarzi, Los Angeles, CA (US);

Inventors:

Kent D. Taylor, Ventura, CA (US);

Jerome I. Rotter, Los Angeles, CA (US);

Huiying Yang, Cerritos, CA (US);

Willa A. Hsueh, Pacific Palisades, CA (US);

Xiuqing Guo, Santa Monica, CA (US);

Leslie J. Raffel, Los Angeles, CA (US);

Mark O. Goodarzi, Los Angeles, CA (US);

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12P 19/34 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method for determining haplotypes useful for large-scale genetic analysis, within a genomic reference sequence of interest, for a human subpopulation. The method can applied to statistically evaluating the genotypes of subjects for any statistically significant association with a phenotype of interest, such as insulin resistance or coronary artery disease. Thus, also disclosed are a method of detecting a genetic predisposition in a Mexican-American human subject for developing insulin resistance and methods of detecting a lower than normal risk in a Mexican-American human subject for developing insulin resistance or coronary artery disease.


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