The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2006

Filed:

Apr. 27, 2004
Applicants:

Jianwen Han, Danbury, CT (US);

Mackenzie E. King, Southbury, CT (US);

Glenn Tom, New Milford, CT (US);

Steven Lurcott, Sherman, CT (US);

Inventors:

Jianwen Han, Danbury, CT (US);

Mackenzie E. King, Southbury, CT (US);

Glenn Tom, New Milford, CT (US);

Steven Lurcott, Sherman, CT (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method for mathematically re-calibrating and adjusting an initial concentration analysis model that suffers from electrochemical measurement errors caused by surface state changes in the working/counter/reference electrode after extended usage. Specifically, such recalibration method reimburses long-term drift in the electrochemical measurements based on a single point testing.


Find Patent Forward Citations

Loading…