The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Oct. 28, 2005
Applicants:
Jay Wei, Fremont, CA (US);
Yonghua Zhao, Fremont, CA (US);
Inventors:
Jay Wei, Fremont, CA (US);
Yonghua Zhao, Fremont, CA (US);
Assignee:
Optovue, Inc., Fremont, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/13 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
An eye examination instrument is presented that can perform multiple eye tests. The instrument includes an illumination optical path and an imaging optical path, wherein a focus element in the illumination optical path is mechanically coupled to a focus element in the imaging optical path. In some embodiments, the eye examination instrument can perform a visual eye test, a fundus imaging test, and an optical coherence tomography test.