The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7140222 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 28, 2006

Filed:

Nov. 09, 2004
Applicants:

Jong Woo Park, Seoul, KR;

Young Hoon Chung, Seoul, KR;

Inventors:

Jong Woo Park, Seoul, KR;

Young Hoon Chung, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21C 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A shear deformation apparatus comprises: a die having an inlet and an outlet; and a rotatable device installed at a shear zone for supporting a material introduced into the inlet of the die and thus changing a direction of the material to the outlet of the die, of which the surface moves together with the material. According to the apparatus, a frictional resistance between the material and the die is reduced and a generation of a dead zone is prevented, thereby reducing a deformation resistance and having a uniform shear deformation.


Find Patent Forward Citations

Park, Jong. (2006). Apparatus and method for uniform shear deformation (U.S. Patent No. 7140222). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7140222

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