The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2006
Filed:
Feb. 26, 2003
Friedrich Hapke, Winsen/Luhe, DE;
Friedrich Hapke, Winsen/Luhe, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
Integrated circuit with an application circuit () to be tested, and a self-test circuit (-) which is provided for testing the application circuit () and comprises an arrangement (-) for generating desired test patterns which are applied to the application circuit () for test purposes, wherein the output signals occurring in dependence upon the test patterns through the application circuit () are evaluated by means of a signature register (), the arrangement (-) for generating the desired test patterns comprising a bit modification circuit () which individually controls first control inputs of combination logics () in such a way that a pseudo-random sequence of test patterns supplied by a shift register is modified such that, by approximation, the desired test patterns are obtained, and which controls second control inputs of the combination logics (), by means of which the first control inputs can be blocked, such that those test patterns that are supplied by the shift register () and are already desired test patterns are not modified by the bit modification circuit () by means of controlling the first control inputs of the combination logics ().