The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2006
Filed:
Apr. 01, 2003
Applicants:
Indradeep Ghosh, San Jose, CA (US);
Liang Zhang, Blacksburg, VA (US);
Inventors:
Indradeep Ghosh, San Jose, CA (US);
Liang Zhang, Blacksburg, VA (US);
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Generating a test environment includes accessing initial test environments for a network of nodes, where a test environment specifies a propagation or justification path for a node. The following are repeated until satisfactory coverage is achieved or until a predetermined number of iterations is reached. A coverage for each test environment is calculated, and at least two of the test environments are mated to generate next test environments, where the coverage of the at least two test environments is greater than the coverage of the other test environments.